Random testing method of microprocessor

Random testing method of microprocessor

This invention relates to a kind of random testing method of microprocessor. It comprises the following steps: (1) generating N random instructions based on random number (N is positive integral); (2) testing microprocessor by these N random instructions. It solves the problem of low efficiency and...

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Hauptverfasser: YIYAN YIN, NING BAI, YUNXIU XU
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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creator YIYAN YIN
NING BAI
YUNXIU XU
description This invention relates to a kind of random testing method of microprocessor. It comprises the following steps: (1) generating N random instructions based on random number (N is positive integral); (2) testing microprocessor by these N random instructions. It solves the problem of low efficiency and low coverage in the course of microprocessor testing. It speeds up the development cycle of microprocessor and ensures the dependability of microprocessor.
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title Random testing method of microprocessor
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