Random testing method of microprocessor
This invention relates to a kind of random testing method of microprocessor. It comprises the following steps: (1) generating N random instructions based on random number (N is positive integral); (2) testing microprocessor by these N random instructions. It solves the problem of low efficiency and...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | This invention relates to a kind of random testing method of microprocessor. It comprises the following steps: (1) generating N random instructions based on random number (N is positive integral); (2) testing microprocessor by these N random instructions. It solves the problem of low efficiency and low coverage in the course of microprocessor testing. It speeds up the development cycle of microprocessor and ensures the dependability of microprocessor. |
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