Method for testing a testable electronic device

本发明公开了一种方法，用来测试具有第一和第二多个测试配置，例如扫描链，的可测试电子装置。第一移位寄存器(110)与第二移位寄存器(130)并行地用来将第一测试矢量(102)和第二测试矢量(104)时分多路复用成很多较小的测试矢量(102a-c；104a-c)，以便供给该第一和第二多个测试配置。通过改变该第一移位寄存器(110)和第二移位寄存器(130)的大小就可在待接触的电子装置的引线数目和所需要的测试时间之间进行权衡。最好是，使第一移位寄存器(110)与第一缓冲寄存器(120)耦合，而使第二移位寄存器(130)与第二缓冲寄存器(140)耦合，以便提高测试数据的稳定性。第一移位寄存器(110)和第二移位寄存器(130)可以是一大的移位寄存器，例如，一边界扫描链的一些分区。该方法还可通过在该可测试电子装置的输出侧将测试结果矢量去时分多路复用成一单个的矢量的方法反过来使用。 In a method for testing a testable electronic device having a first and a second plurality of test a arrangements a first shift register ( 110 ) is used in parallel with a second shift register ( 130 ) to time-multiplex a first test vector ( 102 ) and a second test vector ( 104 ) into a number of smaller test vectors ( 102 a-c; 104 a-c) for provision to the first and second plurality of test arrangements. By varying the size of the first shift register ( 110 ) and the second shift register ( 130 ) a trade-off between the number of pins of the electronic device to be contacted and the required test time can be made. The first shift register ( 110 ) may be coupled to a first buffer register ( 120 ) and second shift register ( 130 ) may be coupled to a second buffer register ( 140 ) for enhanced test data stability. First shift register ( 110 ) and second shift register ( 130 ) can be partitions of a larger shift register. The method can also be used in a reverse way by time-demultiplexing test result vectors into a single vector at the output side of the testable electronic device.