Large-scale three dimensional shape and appearance measuring and splicing method without being based on adhesive mark

Bibliographische Detailangaben

1. Verfasser:	JIGUI,WU ZHU
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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