Component defect detection method and device, electronic equipment and storage medium

The invention discloses a component defect detection method and device, electronic equipment and a storage medium, and relates to the technical field of computer vision, and the method comprises the steps: carrying out the feature extraction of an actual measurement blurred image, obtaining a featur...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: WANG XIN, XIE FEIXUE, ZHANG WENCHAO, LI ZHENGYI, ZHAO QIDONG, XU GUIXUN, MAO XIAOFENG, REN YAN
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The invention discloses a component defect detection method and device, electronic equipment and a storage medium, and relates to the technical field of computer vision, and the method comprises the steps: carrying out the feature extraction of an actual measurement blurred image, obtaining a feature value matrix corresponding to the actual measurement blurred image, and generating a thermodynamic image; determining each sampling line of the thermodynamic image; fitting the average pixel value of each sampling line by adopting a skewed distribution function to obtain a first fitting curve; and determining a second fitting curve corresponding to the corresponding standard clear image by adopting the same processing rule. And determining a defect detection result of the to-be-detected component according to a position relationship between the first fitting curve and the second fitting curve. Compared with a scheme of directly judging the component in the blurred image as a defective component in the prior art,