Component defect detection method and device, electronic equipment and storage medium
The invention discloses a component defect detection method and device, electronic equipment and a storage medium, and relates to the technical field of computer vision, and the method comprises the steps: carrying out the feature extraction of an actual measurement blurred image, obtaining a featur...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a component defect detection method and device, electronic equipment and a storage medium, and relates to the technical field of computer vision, and the method comprises the steps: carrying out the feature extraction of an actual measurement blurred image, obtaining a feature value matrix corresponding to the actual measurement blurred image, and generating a thermodynamic image; determining each sampling line of the thermodynamic image; fitting the average pixel value of each sampling line by adopting a skewed distribution function to obtain a first fitting curve; and determining a second fitting curve corresponding to the corresponding standard clear image by adopting the same processing rule. And determining a defect detection result of the to-be-detected component according to a position relationship between the first fitting curve and the second fitting curve. Compared with a scheme of directly judging the component in the blurred image as a defective component in the prior art, |
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