Feature monitoring method and device, medium, equipment and product
The invention relates to a feature monitoring method and device, a medium, equipment and a product. The method comprises the following steps: receiving a monitoring request for a monitoring index of a first feature, wherein the monitoring index comprises a first index; a first target feature compari...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to a feature monitoring method and device, a medium, equipment and a product. The method comprises the following steps: receiving a monitoring request for a monitoring index of a first feature, wherein the monitoring index comprises a first index; a first target feature comparison result associated with the first feature is obtained from stored feature comparison results, and the first target feature comparison result is used for representing whether feature data of the first feature read from a preset database is consistent with feature data of the first feature calculated through a preset mode or not; according to a second target feature comparison result, the index value of the first index is determined, and the second target feature comparison result is the first target feature comparison result representing that the feature data are consistent. Thus, the consistency performance of the features in different dimensions can be monitored through the monitoring indexes, problems can be f |
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