Blade edge tip measurement
A method of optimizing a blade array of a manufacturing process or a razor cartridge using spatial information for a tip portion of a razor blade, the method comprising the steps of measuring the spatial information by traversing the tip portion of the razor blade with a probe and a probe tip, using...
Gespeichert in:
| Hauptverfasser: | , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | JOLLEY WILLIAM OWEN SLATTERY JASON S MAZIARZ JOHN L KRAUS OLIVER HEINRICH BAXTER MATTHEW JOHN ODONCKER, NICHOLAS, S |
| description | A method of optimizing a blade array of a manufacturing process or a razor cartridge using spatial information for a tip portion of a razor blade, the method comprising the steps of measuring the spatial information by traversing the tip portion of the razor blade with a probe and a probe tip, using an atomic force microscope comprising the probe and the probe tip, a probe having a high aspect ratio of length to half angle, the probe tip having a radius smaller than a radius of a pole tip of the tip portion of the razor blade; analyzing, by one or more processors, the spatial information measured by the atomic force microscope to determine one or more blade characteristics; and using the blade characteristics to adjust the manufacturing process to improve the design of the razor blade, or to adjust the design characteristics of the array of blades to improve the design of the razor cartridge.
一种使用用于剃刀刀片的尖端部分的空间信息来优化制造工艺或剃刀架的刀片阵列的方法，该方法包括以下步骤：使用包括探针和探针尖端的原子力显微镜，通过使该探针横穿该剃刀刀片的该尖端部分来测量该空间信息，该探针具有长度对半侧角的高纵横比，该探针尖 |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN118974568A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN118974568A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN118974568A3</originalsourceid><addsrcrecordid>eNrjZJByyklMSVVITUlPVSjJLFDITU0sLi1KzU3NK-FhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoaGFpbmJqZmFo7GxKgBAC4MIuM</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Blade edge tip measurement</title><source>esp@cenet</source><creator>JOLLEY WILLIAM OWEN ; SLATTERY JASON S ; MAZIARZ JOHN L ; KRAUS OLIVER HEINRICH ; BAXTER MATTHEW JOHN ; ODONCKER, NICHOLAS, S</creator><creatorcontrib>JOLLEY WILLIAM OWEN ; SLATTERY JASON S ; MAZIARZ JOHN L ; KRAUS OLIVER HEINRICH ; BAXTER MATTHEW JOHN ; ODONCKER, NICHOLAS, S</creatorcontrib><description>A method of optimizing a blade array of a manufacturing process or a razor cartridge using spatial information for a tip portion of a razor blade, the method comprising the steps of measuring the spatial information by traversing the tip portion of the razor blade with a probe and a probe tip, using an atomic force microscope comprising the probe and the probe tip, a probe having a high aspect ratio of length to half angle, the probe tip having a radius smaller than a radius of a pole tip of the tip portion of the razor blade; analyzing, by one or more processors, the spatial information measured by the atomic force microscope to determine one or more blade characteristics; and using the blade characteristics to adjust the manufacturing process to improve the design of the razor blade, or to adjust the design characteristics of the array of blades to improve the design of the razor cartridge.
一种使用用于剃刀刀片的尖端部分的空间信息来优化制造工艺或剃刀架的刀片阵列的方法，该方法包括以下步骤：使用包括探针和探针尖端的原子力显微镜，通过使该探针横穿该剃刀刀片的该尖端部分来测量该空间信息，该探针具有长度对半侧角的高纵横比，该探针尖</description><language>chi ; eng</language><subject>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] ; CUTTING ; HAND CUTTING TOOLS ; HAND-HELD CUTTING TOOLS NOT OTHERWISE PROVIDED FOR ; MEASURING ; PERFORMING OPERATIONS ; PHYSICS ; SCANNING-PROBE TECHNIQUES OR APPARATUS ; SEVERING ; TESTING ; TRANSPORTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241115&DB=EPODOC&CC=CN&NR=118974568A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241115&DB=EPODOC&CC=CN&NR=118974568A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>JOLLEY WILLIAM OWEN</creatorcontrib><creatorcontrib>SLATTERY JASON S</creatorcontrib><creatorcontrib>MAZIARZ JOHN L</creatorcontrib><creatorcontrib>KRAUS OLIVER HEINRICH</creatorcontrib><creatorcontrib>BAXTER MATTHEW JOHN</creatorcontrib><creatorcontrib>ODONCKER, NICHOLAS, S</creatorcontrib><title>Blade edge tip measurement</title><description>A method of optimizing a blade array of a manufacturing process or a razor cartridge using spatial information for a tip portion of a razor blade, the method comprising the steps of measuring the spatial information by traversing the tip portion of the razor blade with a probe and a probe tip, using an atomic force microscope comprising the probe and the probe tip, a probe having a high aspect ratio of length to half angle, the probe tip having a radius smaller than a radius of a pole tip of the tip portion of the razor blade; analyzing, by one or more processors, the spatial information measured by the atomic force microscope to determine one or more blade characteristics; and using the blade characteristics to adjust the manufacturing process to improve the design of the razor blade, or to adjust the design characteristics of the array of blades to improve the design of the razor cartridge.
一种使用用于剃刀刀片的尖端部分的空间信息来优化制造工艺或剃刀架的刀片阵列的方法，该方法包括以下步骤：使用包括探针和探针尖端的原子力显微镜，通过使该探针横穿该剃刀刀片的该尖端部分来测量该空间信息，该探针具有长度对半侧角的高纵横比，该探针尖</description><subject>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]</subject><subject>CUTTING</subject><subject>HAND CUTTING TOOLS</subject><subject>HAND-HELD CUTTING TOOLS NOT OTHERWISE PROVIDED FOR</subject><subject>MEASURING</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>SCANNING-PROBE TECHNIQUES OR APPARATUS</subject><subject>SEVERING</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJByyklMSVVITUlPVSjJLFDITU0sLi1KzU3NK-FhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoaGFpbmJqZmFo7GxKgBAC4MIuM</recordid><startdate>20241115</startdate><enddate>20241115</enddate><creator>JOLLEY WILLIAM OWEN</creator><creator>SLATTERY JASON S</creator><creator>MAZIARZ JOHN L</creator><creator>KRAUS OLIVER HEINRICH</creator><creator>BAXTER MATTHEW JOHN</creator><creator>ODONCKER, NICHOLAS, S</creator><scope>EVB</scope></search><sort><creationdate>20241115</creationdate><title>Blade edge tip measurement</title><author>JOLLEY WILLIAM OWEN ; SLATTERY JASON S ; MAZIARZ JOHN L ; KRAUS OLIVER HEINRICH ; BAXTER MATTHEW JOHN ; ODONCKER, NICHOLAS, S</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN118974568A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]</topic><topic>CUTTING</topic><topic>HAND CUTTING TOOLS</topic><topic>HAND-HELD CUTTING TOOLS NOT OTHERWISE PROVIDED FOR</topic><topic>MEASURING</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>SCANNING-PROBE TECHNIQUES OR APPARATUS</topic><topic>SEVERING</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>JOLLEY WILLIAM OWEN</creatorcontrib><creatorcontrib>SLATTERY JASON S</creatorcontrib><creatorcontrib>MAZIARZ JOHN L</creatorcontrib><creatorcontrib>KRAUS OLIVER HEINRICH</creatorcontrib><creatorcontrib>BAXTER MATTHEW JOHN</creatorcontrib><creatorcontrib>ODONCKER, NICHOLAS, S</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>JOLLEY WILLIAM OWEN</au><au>SLATTERY JASON S</au><au>MAZIARZ JOHN L</au><au>KRAUS OLIVER HEINRICH</au><au>BAXTER MATTHEW JOHN</au><au>ODONCKER, NICHOLAS, S</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Blade edge tip measurement</title><date>2024-11-15</date><risdate>2024</risdate><abstract>A method of optimizing a blade array of a manufacturing process or a razor cartridge using spatial information for a tip portion of a razor blade, the method comprising the steps of measuring the spatial information by traversing the tip portion of the razor blade with a probe and a probe tip, using an atomic force microscope comprising the probe and the probe tip, a probe having a high aspect ratio of length to half angle, the probe tip having a radius smaller than a radius of a pole tip of the tip portion of the razor blade; analyzing, by one or more processors, the spatial information measured by the atomic force microscope to determine one or more blade characteristics; and using the blade characteristics to adjust the manufacturing process to improve the design of the razor blade, or to adjust the design characteristics of the array of blades to improve the design of the razor cartridge.
一种使用用于剃刀刀片的尖端部分的空间信息来优化制造工艺或剃刀架的刀片阵列的方法，该方法包括以下步骤：使用包括探针和探针尖端的原子力显微镜，通过使该探针横穿该剃刀刀片的该尖端部分来测量该空间信息，该探针具有长度对半侧角的高纵横比，该探针尖</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN118974568A |
| source | esp@cenet |
| subjects | APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] CUTTING HAND CUTTING TOOLS HAND-HELD CUTTING TOOLS NOT OTHERWISE PROVIDED FOR MEASURING PERFORMING OPERATIONS PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS SEVERING TESTING TRANSPORTING |
| title | Blade edge tip measurement |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-05T09%3A48%3A38IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=JOLLEY%20WILLIAM%20OWEN&rft.date=2024-11-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN118974568A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |