Blade edge tip measurement

A method of optimizing a blade array of a manufacturing process or a razor cartridge using spatial information for a tip portion of a razor blade, the method comprising the steps of measuring the spatial information by traversing the tip portion of the razor blade with a probe and a probe tip, using...

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Bibliographische Detailangaben
Hauptverfasser: JOLLEY WILLIAM OWEN, SLATTERY JASON S, MAZIARZ JOHN L, KRAUS OLIVER HEINRICH, BAXTER MATTHEW JOHN, ODONCKER, NICHOLAS, S
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:A method of optimizing a blade array of a manufacturing process or a razor cartridge using spatial information for a tip portion of a razor blade, the method comprising the steps of measuring the spatial information by traversing the tip portion of the razor blade with a probe and a probe tip, using an atomic force microscope comprising the probe and the probe tip, a probe having a high aspect ratio of length to half angle, the probe tip having a radius smaller than a radius of a pole tip of the tip portion of the razor blade; analyzing, by one or more processors, the spatial information measured by the atomic force microscope to determine one or more blade characteristics; and using the blade characteristics to adjust the manufacturing process to improve the design of the razor blade, or to adjust the design characteristics of the array of blades to improve the design of the razor cartridge. 一种使用用于剃刀刀片的尖端部分的空间信息来优化制造工艺或剃刀架的刀片阵列的方法,该方法包括以下步骤:使用包括探针和探针尖端的原子力显微镜,通过使该探针横穿该剃刀刀片的该尖端部分来测量该空间信息,该探针具有长度对半侧角的高纵横比,该探针尖