Factory layout evaluation and optimization method and device

The invention provides a factory layout evaluation and optimization method and device. The method comprises the steps of obtaining factory data; calculating and determining a value-added heat map of corresponding factory space layout, personnel and operation, resources and information based on the f...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	OUYANG WEIJUN, DAI YULONG, TAN YUEJIN, YU HAIYUE, JIANG JIANG, HU CHONGSHUANG, DOU YAJIE, TANG SHUAIWEN, WANG JIKAI, XIANG NAN, YANG KEWEI, JIA QINGYANG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC DIGITAL DATA PROCESSING PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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