Factory layout evaluation and optimization method and device
The invention provides a factory layout evaluation and optimization method and device. The method comprises the steps of obtaining factory data; calculating and determining a value-added heat map of corresponding factory space layout, personnel and operation, resources and information based on the f...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a factory layout evaluation and optimization method and device. The method comprises the steps of obtaining factory data; calculating and determining a value-added heat map of corresponding factory space layout, personnel and operation, resources and information based on the factory data; based on the value-added heat map, value-added density indexes of the space, personnel, resources and information of the factory are determined; determining space, personnel and resource utilization rates based on the value-added density index; calculating discrete equal probability entropies about physical components, visual control panels and assembly production lines in the production line based on factory data; determining an optimization direction of a workstation in the production line based on discrete equal probability entropy analysis; calculating complexity conditions of different dimensions of a workstation in the production line based on the factory data; and based on the optimization direc |
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