Factory layout evaluation and optimization method and device

The invention provides a factory layout evaluation and optimization method and device. The method comprises the steps of obtaining factory data; calculating and determining a value-added heat map of corresponding factory space layout, personnel and operation, resources and information based on the f...

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Hauptverfasser: OUYANG WEIJUN, DAI YULONG, TAN YUEJIN, YU HAIYUE, JIANG JIANG, HU CHONGSHUANG, DOU YAJIE, TANG SHUAIWEN, WANG JIKAI, XIANG NAN, YANG KEWEI, JIA QINGYANG
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention provides a factory layout evaluation and optimization method and device. The method comprises the steps of obtaining factory data; calculating and determining a value-added heat map of corresponding factory space layout, personnel and operation, resources and information based on the factory data; based on the value-added heat map, value-added density indexes of the space, personnel, resources and information of the factory are determined; determining space, personnel and resource utilization rates based on the value-added density index; calculating discrete equal probability entropies about physical components, visual control panels and assembly production lines in the production line based on factory data; determining an optimization direction of a workstation in the production line based on discrete equal probability entropy analysis; calculating complexity conditions of different dimensions of a workstation in the production line based on the factory data; and based on the optimization direc