Fault detection method and system for direct current magnetic bias resisting mutual inductor with wide metering range

The invention discloses a fault detection method and system for a direct current magnetic bias resisting mutual inductor with a wide metering range, and relates to the technical field of power mutual inductor fault detection. Mechanical data, current data and judgment standard data of each direct cu...

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Hauptverfasser:	DAI YANJIE, XING YU, SUN KAI, ZHU FU, FA YUNING, GUO KAIXUAN, LIU MI, DONG XIANGUANG, ZHAI XIAOHUI, ZHAO JIFU, WANG SIXIAN, LIU MEIMING, WANG YAN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CALCULATING COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	The invention discloses a fault detection method and system for a direct current magnetic bias resisting mutual inductor with a wide metering range, and relates to the technical field of power mutual inductor fault detection. Mechanical data, current data and judgment standard data of each direct current magnetic bias resisting mutual inductor with the wide metering range in a working state are collected; constructing a constant data set, a variable data set and an algorithm data set, and constructing a reference data set at the same time; generating a work abnormal data set based on the constant data set, the variable data set and the reference data set; generating a troubleshooting data set based on the abnormal working data set, the algorithm data set and the reference data set; calculating and generating a maintenance period based on the abnormal working data set, the troubleshooting data set and the reference data set; and judging and generating a corresponding analysis report based on the abnormal worki