Inspection system, display device, and defective pixel compensation method
The invention discloses an inspection system for inspecting a display device, a display device for compensating a defective pixel, and a defective pixel compensation method. An inspection system for inspecting a display device including pixels includes: a camera for capturing the display device and...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | YIM HYUNG-WOO KIM SEYOON PARK SEUNG HO KIM MIN-KYU |
description | The invention discloses an inspection system for inspecting a display device, a display device for compensating a defective pixel, and a defective pixel compensation method. An inspection system for inspecting a display device including pixels includes: a camera for capturing the display device and providing a sensed image signal; and an inspection device for receiving the sensed image signal and outputting a compensation signal for compensating the brightness of the defective pixel. The inspection apparatus includes: an image detector outputting a sensing input signal corresponding to a sensing image signal; a defect coordinate detector that detects a defect pixel based on the sensing input signal and outputs a defect coordinate indicating a position of the defect pixel; an image analyzer that analyzes consistency of defect coordinates based on the sensing image signal and the sensing input signal and outputs final coordinates; and a defect compensation calculator that outputs a compensation signal for adjus |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN118865842A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN118865842A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN118865842A3</originalsourceid><addsrcrecordid>eNrjZPDyzCsuSE0uyczPUyiuLC5JzdVRSMksLshJrFRISS3LTE7VUUjMSwGy00CqylIVCjIrUnMUkvNzC1LzihPBGnNTSzLyU3gYWNMSc4pTeaE0N4Oim2uIs4duakF-fGpxQWJyal5qSbyzn6GhhYWZqYWJkaMxMWoAOX41Ww</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Inspection system, display device, and defective pixel compensation method</title><source>esp@cenet</source><creator>YIM HYUNG-WOO ; KIM SEYOON ; PARK SEUNG HO ; KIM MIN-KYU</creator><creatorcontrib>YIM HYUNG-WOO ; KIM SEYOON ; PARK SEUNG HO ; KIM MIN-KYU</creatorcontrib><description>The invention discloses an inspection system for inspecting a display device, a display device for compensating a defective pixel, and a defective pixel compensation method. An inspection system for inspecting a display device including pixels includes: a camera for capturing the display device and providing a sensed image signal; and an inspection device for receiving the sensed image signal and outputting a compensation signal for compensating the brightness of the defective pixel. The inspection apparatus includes: an image detector outputting a sensing input signal corresponding to a sensing image signal; a defect coordinate detector that detects a defect pixel based on the sensing input signal and outputs a defect coordinate indicating a position of the defect pixel; an image analyzer that analyzes consistency of defect coordinates based on the sensing image signal and the sensing input signal and outputs final coordinates; and a defect compensation calculator that outputs a compensation signal for adjus</description><language>chi ; eng</language><subject>ADVERTISING ; ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION ; CALCULATING ; COMPUTING ; COUNTING ; CRYPTOGRAPHY ; DISPLAY ; EDUCATION ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; MEASURING ; PHYSICS ; SEALS ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241029&DB=EPODOC&CC=CN&NR=118865842A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241029&DB=EPODOC&CC=CN&NR=118865842A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YIM HYUNG-WOO</creatorcontrib><creatorcontrib>KIM SEYOON</creatorcontrib><creatorcontrib>PARK SEUNG HO</creatorcontrib><creatorcontrib>KIM MIN-KYU</creatorcontrib><title>Inspection system, display device, and defective pixel compensation method</title><description>The invention discloses an inspection system for inspecting a display device, a display device for compensating a defective pixel, and a defective pixel compensation method. An inspection system for inspecting a display device including pixels includes: a camera for capturing the display device and providing a sensed image signal; and an inspection device for receiving the sensed image signal and outputting a compensation signal for compensating the brightness of the defective pixel. The inspection apparatus includes: an image detector outputting a sensing input signal corresponding to a sensing image signal; a defect coordinate detector that detects a defect pixel based on the sensing input signal and outputs a defect coordinate indicating a position of the defect pixel; an image analyzer that analyzes consistency of defect coordinates based on the sensing image signal and the sensing input signal and outputs final coordinates; and a defect compensation calculator that outputs a compensation signal for adjus</description><subject>ADVERTISING</subject><subject>ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION</subject><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>CRYPTOGRAPHY</subject><subject>DISPLAY</subject><subject>EDUCATION</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>SEALS</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPDyzCsuSE0uyczPUyiuLC5JzdVRSMksLshJrFRISS3LTE7VUUjMSwGy00CqylIVCjIrUnMUkvNzC1LzihPBGnNTSzLyU3gYWNMSc4pTeaE0N4Oim2uIs4duakF-fGpxQWJyal5qSbyzn6GhhYWZqYWJkaMxMWoAOX41Ww</recordid><startdate>20241029</startdate><enddate>20241029</enddate><creator>YIM HYUNG-WOO</creator><creator>KIM SEYOON</creator><creator>PARK SEUNG HO</creator><creator>KIM MIN-KYU</creator><scope>EVB</scope></search><sort><creationdate>20241029</creationdate><title>Inspection system, display device, and defective pixel compensation method</title><author>YIM HYUNG-WOO ; KIM SEYOON ; PARK SEUNG HO ; KIM MIN-KYU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN118865842A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>ADVERTISING</topic><topic>ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION</topic><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>CRYPTOGRAPHY</topic><topic>DISPLAY</topic><topic>EDUCATION</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>SEALS</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>YIM HYUNG-WOO</creatorcontrib><creatorcontrib>KIM SEYOON</creatorcontrib><creatorcontrib>PARK SEUNG HO</creatorcontrib><creatorcontrib>KIM MIN-KYU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YIM HYUNG-WOO</au><au>KIM SEYOON</au><au>PARK SEUNG HO</au><au>KIM MIN-KYU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Inspection system, display device, and defective pixel compensation method</title><date>2024-10-29</date><risdate>2024</risdate><abstract>The invention discloses an inspection system for inspecting a display device, a display device for compensating a defective pixel, and a defective pixel compensation method. An inspection system for inspecting a display device including pixels includes: a camera for capturing the display device and providing a sensed image signal; and an inspection device for receiving the sensed image signal and outputting a compensation signal for compensating the brightness of the defective pixel. The inspection apparatus includes: an image detector outputting a sensing input signal corresponding to a sensing image signal; a defect coordinate detector that detects a defect pixel based on the sensing input signal and outputs a defect coordinate indicating a position of the defect pixel; an image analyzer that analyzes consistency of defect coordinates based on the sensing image signal and the sensing input signal and outputs final coordinates; and a defect compensation calculator that outputs a compensation signal for adjus</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi ; eng |
recordid | cdi_epo_espacenet_CN118865842A |
source | esp@cenet |
subjects | ADVERTISING ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION CALCULATING COMPUTING COUNTING CRYPTOGRAPHY DISPLAY EDUCATION IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING PHYSICS SEALS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
title | Inspection system, display device, and defective pixel compensation method |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T10%3A56%3A26IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=YIM%20HYUNG-WOO&rft.date=2024-10-29&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN118865842A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |