Inspection system, display device, and defective pixel compensation method

The invention discloses an inspection system for inspecting a display device, a display device for compensating a defective pixel, and a defective pixel compensation method. An inspection system for inspecting a display device including pixels includes: a camera for capturing the display device and...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: YIM HYUNG-WOO, KIM SEYOON, PARK SEUNG HO, KIM MIN-KYU
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses an inspection system for inspecting a display device, a display device for compensating a defective pixel, and a defective pixel compensation method. An inspection system for inspecting a display device including pixels includes: a camera for capturing the display device and providing a sensed image signal; and an inspection device for receiving the sensed image signal and outputting a compensation signal for compensating the brightness of the defective pixel. The inspection apparatus includes: an image detector outputting a sensing input signal corresponding to a sensing image signal; a defect coordinate detector that detects a defect pixel based on the sensing input signal and outputs a defect coordinate indicating a position of the defect pixel; an image analyzer that analyzes consistency of defect coordinates based on the sensing image signal and the sensing input signal and outputs final coordinates; and a defect compensation calculator that outputs a compensation signal for adjus