Manufacturing method of interconnection structure
The invention discloses a manufacturing method of an interconnection structure, and the method comprises the steps: providing a substrate which is provided with a first dielectric layer, and the first dielectric layer is provided with a first conductor; forming a second dielectric layer on the first...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a manufacturing method of an interconnection structure, and the method comprises the steps: providing a substrate which is provided with a first dielectric layer, and the first dielectric layer is provided with a first conductor; forming a second dielectric layer on the first dielectric layer; forming a trench in the second dielectric layer to expose a top surface of the first conductor; and performing an annealing process on the top surface of the first conductor under the conditions of an annealing temperature of 400-450 DEG C for less than 5 minutes, and a gaseous environment comprising hydrogen and nitrogen.
本发明公开一种互连结构的制作方法,包括:提供衬底,所述衬底上具有第一介电层,所述第一介电层中具有第一导体;在所述第一介电层上形成第二介电层;在所述第二介电层中形成沟槽以暴露所述第一导体的顶面;以及对所述第一导体的顶面进行退火工艺,其条件包括400~450℃的退火温度,持续时间少于5分钟,以及包含氢气和氮气的气体环境。 |
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