Impedance matcher, impedance matching method and plasma processing system

An impedance matcher, an impedance matching method and a plasma processing system, the impedance matcher comprising: a first detection unit suitable for acquiring a first voltage amplitude and a first current amplitude of an input end of the impedance matcher and a phase difference between a first d...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: XUE JINGLONG, XIAO ZHIQIANG, LI NAN, ZHANG ZHIYING, NAN YANRONG, ZHANG YANG
Format: Patent
Sprache:chi ; eng
Schlagworte:
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