Method for determining tellurium content in high-temperature alloy by inductively coupled plasma mass spectrometry
The invention discloses a method for measuring tellurium content in high-temperature alloy by inductively coupled plasma mass spectrometry, which comprises the following steps: preparing various reagents for testing, including tellurium standard solution; preparing a nickel matrix solution; preparin...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a method for measuring tellurium content in high-temperature alloy by inductively coupled plasma mass spectrometry, which comprises the following steps: preparing various reagents for testing, including tellurium standard solution; preparing a nickel matrix solution; preparing a series of standard solutions by using the tellurium standard solution and the nickel matrix solution; preparing an analysis test solution of the iron-nickel-based superalloy; debugging and optimizing the inductively coupled plasma mass spectrometer, selecting a DRC mode for measurement, and setting working parameters in the mode; sequentially measuring the series of standard solutions, drawing a tellurium element mass concentration-emission mass spectrum intensity working curve according to the measurement result, then measuring the analysis test solution, and obtaining the corresponding tellurium element mass concentration according to the measured emission mass spectrum intensity and the working curve; and ca |
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