Apparatus, test card and method for testing photonic integrated circuit, and photonic integrated circuit

An apparatus and test card for testing a photonic integrated circuit, a corresponding system and a photonic integrated circuit are provided. In this case, the test card (24) is imaged onto the photonic integrated circuit (22) to be tested by the optical unit (20). Parallel illumination of the photon...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: RICHTER STEFAN, HART TYLER, ZWICKEL, HEINZ
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:An apparatus and test card for testing a photonic integrated circuit, a corresponding system and a photonic integrated circuit are provided. In this case, the test card (24) is imaged onto the photonic integrated circuit (22) to be tested by the optical unit (20). Parallel illumination of the photonic integrated circuit (22) at different locations is possible in this way. 提供了一种用于测试光子集成电路的设备和测试卡、相应系统和光子集成电路。在这种情况下,测试卡(24)通过光学单元(20)成像到待测光子集成电路(22)上。该光子集成电路(22)在不同位置的平行照明以这种方式是可实现的。