Testing device and testing method for laser chip
The invention relates to the technical field of chip testing, and provides a testing device and a testing method for a laser chip. The testing device of the laser chip comprises a working table, a tray assembly, a pickup assembly, a detection assembly and a photoelectric testing assembly, the pickup...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to the technical field of chip testing, and provides a testing device and a testing method for a laser chip. The testing device of the laser chip comprises a working table, a tray assembly, a pickup assembly, a detection assembly and a photoelectric testing assembly, the pickup assembly moves a transition packaging chip between the tray assembly and the working table, the transition packaging chip is a laser chip packaged through a transition block, the working table is used for bearing the transition packaging chip, and the detection assembly is used for detecting the photoelectric testing assembly. The detection assembly applies different test electric signals to the transition packaging chip through different probes, the transition packaging chip emits optical signals based on the test electric signals, and the photoelectric test assembly tests the optical signals. Compared with the direct measurement of the laser chip, the testing device provided by the invention can measure the high |
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