Similarity determination method, similarity correction parameter determination method and related device

The invention discloses a similarity determination method, a similarity correction parameter determination method and a related device. The similarity determination method comprises the steps of obtaining a target image feature and a prompt feature corresponding to a to-be-detected target; obtaining...

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Hauptverfasser: CHEN WANLI, ZHAO RUI, ZHAO CHENYANG, YU YANGJIAN, ZENG XINGYU, SU SHUTING
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a similarity determination method, a similarity correction parameter determination method and a related device. The similarity determination method comprises the steps of obtaining a target image feature and a prompt feature corresponding to a to-be-detected target; obtaining an initial similarity between the prompt feature and the target image feature; correcting the initial similarity by using a similarity correction parameter corresponding to the prompt feature to obtain a target similarity between the prompt feature and the target image feature, the similarity correction parameter is determined based on a first sample image feature corresponding to the to-be-detected target, a prompt feature and a real similarity between the first sample image feature and the prompt feature. According to the scheme, the similarity representation accuracy can be improved. 本申请公开了一种相似度确定方法、相似度修正参数确定方法及相关装置,相似度确定方法包括获取目标图像特征和待检测目标对应的提示特征;获取提示特征与目标图像特征之间的初始相似度;利用提示特征对应的相似度修正参数对初始相似度进行修正,得到提示特征与目标图像特征之间的