Method for determining 24 impurity elements in silver based on ICP-MS (Inductively Coupled Plasma Mass Spectrometry)
The invention discloses a method for determining 24 impurity elements in silver based on ICP-MS. The method comprises the following steps: firstly, decomposing a silver sample with nitric acid, in a 5% nitric acid medium, determining the contents of impurity elements such as magnesium, titanium, chr...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a method for determining 24 impurity elements in silver based on ICP-MS. The method comprises the following steps: firstly, decomposing a silver sample with nitric acid, in a 5% nitric acid medium, determining the contents of impurity elements such as magnesium, titanium, chromium, vanadium, manganese, copper, iron, cobalt, nickel, zinc, gallium, germanium, lead, tin, cadmium, strontium, zirconium, molybdenum, arsenic, antimony, barium, thallium, bismuth and tellurium in the silver by adopting an on-line internal standard element yttrium adding and matrix matching method and utilizing ICP-MS. According to the method, the detection limit is 0.003-0.483 [mu] g/L, the adding standard recovery rate of each element is 89.12%-119.68%, and the relative standard deviation is 1.20%-21.38%. The method disclosed by the invention has the characteristics of simple treatment flow of the sample silver, easiness in operation, wide impurity element determination range and relatively high determination |
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