Terahertz wave beam scanning imaging system and scanning imaging method

The invention discloses a terahertz wave beam scanning imaging system and method, and the system comprises a terahertz source which is controlled to emit continuous terahertz wave beams with different frequencies; the metasurface chip is located on an emitting path of the terahertz source and can em...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ZHOU QI, JIN LIN, CAI XINHANG, WANG MAO, QIN HUA, YU RUN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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