Terahertz wave beam scanning imaging system and scanning imaging method
The invention discloses a terahertz wave beam scanning imaging system and method, and the system comprises a terahertz source which is controlled to emit continuous terahertz wave beams with different frequencies; the metasurface chip is located on an emitting path of the terahertz source and can em...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a terahertz wave beam scanning imaging system and method, and the system comprises a terahertz source which is controlled to emit continuous terahertz wave beams with different frequencies; the metasurface chip is located on an emitting path of the terahertz source and can emit continuous terahertz wave beams which are irradiated to the metasurface chip and have different frequencies at different direction angles in the theta direction; the moving assembly acts on the metasurface chip to enable the metasurface chip to rotate so as to emit the continuous terahertz wave beams with different frequencies irradiated to the metasurface chip at different direction angles in the phi direction; and the detector is used for receiving the reflected or scattered wave beam signals so as to carry out two-dimensional imaging in the theta direction and the phi direction. According to the terahertz wave beam scanning imaging system and the terahertz wave beam scanning imaging method, the scanning speed |
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