Well location information reliability analysis method and device based on Bayesian model

The invention discloses a Bayesian model-based well location information reliability analysis method and device, and the method comprises the steps: obtaining the prior probability of the overall reservoir quality of an exploratory area and the local reservoir quality probability of a well location...

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Hauptverfasser: WANG JINCAI, JIANG REN, XU ANZHU, ZENG XING, BO BING, SONG HENG, HOU JUE, LYU MINGSHENG, HE CONGGE, LUO ERHUI, LI YI
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a Bayesian model-based well location information reliability analysis method and device, and the method comprises the steps: obtaining the prior probability of the overall reservoir quality of an exploratory area and the local reservoir quality probability of a well location of each well spacing scheme; based on the well location local reservoir quality probability of each well spacing scheme, obtaining a well location local reservoir quality joint normalization probability of each well spacing scheme; based on a Bayesian model, the distribution probability of the overall reservoir quality of the exploratory area under various conditions of the well location local reservoir quality is obtained, the probability that the well location local information accurately reflects the overall information of the exploratory area is calculated, the well location information reliability of the well spacing schemes is evaluated, well location information reliability sorting and optimization are carri