Two-dimensional nano material anisotropy detection method

The invention is applicable to the technical field of material detection, and provides a two-dimensional nano material anisotropy detection method, which comprises the following steps: respectively preparing a first solution with the PDMS concentration of 0.002-0.008 g/ml and a second solution with...

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Bibliographische Detailangaben
Hauptverfasser: CHEN ZHIWEI, YU WEIRUI, XIONG HONGJIN, SU YIKUN, LUO JUNXUAN, ZHAO JINGLAI
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention is applicable to the technical field of material detection, and provides a two-dimensional nano material anisotropy detection method, which comprises the following steps: respectively preparing a first solution with the PDMS concentration of 0.002-0.008 g/ml and a second solution with the PDMS concentration of 0.03-0.07 g/ml by using PDMS, a curing agent, 1, 1, 2, 2,-tetra (4-nitrophenyl) ethane and a solvent; and sequentially spin-coating the first solution and the second solution on the surface of the suspended two-dimensional nano material, and testing the two-dimensional nano material sample under a confocal microscope, so as to determine the anisotropy of the two-dimensional nano material sample based on the directions of the long axis and the short axis of the elliptical light spot on the fluorescence image. According to the invention, the surface of the suspended two-dimensional nano material is coated with the aggregation-induced emission film material with a specific concentration, so t