Apparatus, method and system for calibrating sense capacitor in sense circuit for reading memory cell

Disclosed herein are devices, methods, and systems for calibrating a sensing capacitance value used by a sensing circuit when reading a memory cell of a memory. The calibration circuit includes a calibration cell associated with a predefined programming state of the calibration cell. The calibration circuit further includes a read circuit configured to perform a read operation on the calibration cell and to convert the calibration voltage to a target capacitance value based on the calibration voltage, the read operation generating the calibration voltage based on a predefined programming state. The read circuit is configured to provide a target capacitance value to the memory as a sense capacitance used by the sense circuit when reading memory cells of the memory. 本文公开了用于在读取存储器的存储器单元时校准由感测电路使用的感测电容值的设备、方法和系统。校准电路包括与校准单元的预定义的编程状态相关联的校准单元。校准电路还包括读取电路，该读取电路被配置为对校准单元执行读取操作并基于校准电压将校准电压转换成目标电容值，该读取操作基于预定义的编程状态产生校准电压。读取电路被配置为向存储器提供目标电容值作为在读取存储器的存储器单元时感测电路使用的感测电容。