Method for measuring illumination angle of frequency spectrum conjugate Fourier lamination microscopic imaging system

The invention relates to the technical field of optical microscopic imaging calculation, in particular to a method for measuring the illumination angle of a frequency spectrum conjugate Fourier laminated microscopic imaging system, which comprises the following steps of: inserting an additional lens between a barrel lens and a camera to ensure the conjugate relationship between the rear focal plane of an objective lens and the target surface of the camera; placing an area light source on an objective table, obtaining a spectrum circle image by using a camera, and determining a reference center coordinate and a cut-off frequency radius of the spectrum circle image; the area light source is taken down, LED lamp beads are sequentially lightened, a series of light spot images at different illumination angles are collected, and the illumination angle of the lamp bead corresponding to each bright spot is calculated according to the reference center coordinate and the cut-off frequency radius; and finally, the addit