Defect detection model dynamic optimization method and device, medium and equipment
The invention provides a defect detection model dynamic optimization method and device, a medium and equipment. The method comprises the following steps: adjusting initial structure parameters of a basic defect detection model according to computing resources and network bandwidth of each edge devic...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a defect detection model dynamic optimization method and device, a medium and equipment. The method comprises the following steps: adjusting initial structure parameters of a basic defect detection model according to computing resources and network bandwidth of each edge device to obtain a model structure adaptive to the edge device; data acquisition is carried out on various sensors to obtain various acquisition data; based on a self-attention mechanism, performing multi-modal fusion processing on the multiple kinds of acquisition data to obtain fusion feature data; training a model structure corresponding to each edge device by using a training set formed by the fused feature data to obtain a first defect detection model corresponding to the edge device; and issuing the first defect detection model corresponding to each edge device to the edge device based on differential privacy and a data encryption technology, so that the edge device carries out model deployment. According to the i |
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