Defect detection model dynamic optimization method and device, medium and equipment

The invention provides a defect detection model dynamic optimization method and device, a medium and equipment. The method comprises the following steps: adjusting initial structure parameters of a basic defect detection model according to computing resources and network bandwidth of each edge devic...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: WU SHAOTONG, YANG XINYU, ZHANG WENLONG, TANG QIAOMING
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The invention provides a defect detection model dynamic optimization method and device, a medium and equipment. The method comprises the following steps: adjusting initial structure parameters of a basic defect detection model according to computing resources and network bandwidth of each edge device to obtain a model structure adaptive to the edge device; data acquisition is carried out on various sensors to obtain various acquisition data; based on a self-attention mechanism, performing multi-modal fusion processing on the multiple kinds of acquisition data to obtain fusion feature data; training a model structure corresponding to each edge device by using a training set formed by the fused feature data to obtain a first defect detection model corresponding to the edge device; and issuing the first defect detection model corresponding to each edge device to the edge device based on differential privacy and a data encryption technology, so that the edge device carries out model deployment. According to the i