ONFI TESTCHIP built-in self-test method and device based on LFSR design

The invention discloses an ONFI TESTCHIP built-in self-test method and an ONFI TESTCHIP built-in self-test device based on an LFSR design. In combination with an LFSR circuit and an ECC verification method, multiple modes of test data (sequential, fixed and random) are selected based on MUX. In a writing stage, the LFSR generates a random number test sequence, and in the writing stage, the LFSR generates data and transmits the data to the CONTROLLER; in the reading stage, the LFSR generates a comparison sequence and compares the comparison sequence with the read-back data, in the check mode of the sequence number and the fixed number, a read-write data path from the SRAMs to the NAND FLASH is detected, and if the data is reported to be wrong, the error position is recorded. According to the invention, a plurality of modes of test sequences are provided to carry out synchronous test on the random combination of the plurality of test branches, sectional path detection and multi-path detection are realized, the