Method for generating abnormality determination model, abnormality determination device, abnormality determination method, and learned model

A method for generating an abnormality determination model includes: detecting a load of a subject (S) by load sensors (LS1, LS2, LS3, LS4) disposed on a bed (BD); creating teaching data in which a plurality of types of feature quantities obtained on the basis of the detected load are associated wit...

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Hauptverfasser: FUSE TORU, ZAITSU YUSUKE
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:A method for generating an abnormality determination model includes: detecting a load of a subject (S) by load sensors (LS1, LS2, LS3, LS4) disposed on a bed (BD); creating teaching data in which a plurality of types of feature quantities obtained on the basis of the detected load are associated with abnormal states; creating a model for classifying the state of the subject as the abnormal state on the basis of the plurality of feature quantities by supervised machine learning using the teaching data, and determining at least one of the plurality of feature quantities as an explanatory variable on the basis of the model; and generating an abnormality determination model for determining that the subject is in the abnormal state based on the explanatory variables by machine learning using the explanatory variables. The plurality of types of feature quantities include a frequency feature quantity calculated by performing a short-time Fourier transform on a load of the subject. 异常判定模型的生成方法包括:通过配置于床(BD)的载荷传感器(LS1、