Wafer focal plane database acquisition method and device, storage medium and terminal

The invention discloses a wafer focal plane database obtaining method and device, a storage medium and a terminal, and the method comprises the steps: obtaining wafer image data when a wafer is located at a plurality of image obtaining heights, and calculating the image feature value of each image m...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: HAN JINGSHAN, LI JUANXIU
Format: Patent
Sprache:chi ; eng
Schlagworte:
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