Full-automatic IC test sorting machine

The invention belongs to the technical field of chip testing, and particularly relates to a full-automatic IC testing and sorting machine which comprises a chip steering and positioning structure, a tray box structure, a multi-suction-nozzle carrying structure, a tray circumferential channel structu...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	LIANG DAMING
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PERFORMING OPERATIONS PHYSICS POSTAL SORTING SEPARATING SOLIDS FROM SOLIDS SORTING SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTEDPIECE-MEAL, e.g. BY PICKING TESTING TRANSPORTING
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