Full-automatic IC test sorting machine

The invention belongs to the technical field of chip testing, and particularly relates to a full-automatic IC testing and sorting machine which comprises a chip steering and positioning structure, a tray box structure, a multi-suction-nozzle carrying structure, a tray circumferential channel structure, a tray stacking structure, a structure for pushing materials into a cavity, a temperature control structure, a feeding testing structure, a discharging temperature returning structure and a connection relation of the chip steering and positioning structure, the tray box structure, the multi-suction-nozzle carrying structure, the tray circumferential channel structure, the tray stacking structure, the structure for pushing the materials into the cavity, the temperature control structure and the discharging temperature returning structure. By arranging the chip steering and positioning structure, the material tray box structure, the multi-suction-nozzle carrying structure, the material tray circumferential channe