Chip grading method and device, chip grouping method and device, electronic equipment and storage medium

The embodiment of the invention discloses a chip grading method and device, a chip grouping method and device, electronic equipment and a storage medium, relates to the technical field of chip testing, and can effectively improve the utilization rate of chip testing capacity. The method comprises the following steps: acquiring test parameters of a to-be-graded chip; based on the product information of the chip, determining a grading calculation model for grading the chip; and taking the test parameters as the input of the hierarchical calculation model, performing hierarchical calculation by using the hierarchical calculation model, and determining the specification grade of the chip. The chip grading method and device are suitable for scenes for grading chips. 本申请的实施例公开了一种芯片分级方法、分组方法、装置、电子设备及存储介质，涉及芯片测试技术领域，能够有效提高芯片测试产能的利用率。所述方法包括：获取待分级芯片的测试参数；基于所述芯片的产品信息，确定对所述芯片进行分级的分级计算模型；将所述测试参数作为所述分级计算模型的输入，利用所述分级计算模型进行分级计算，确定所述芯片的规格等级。本发明适用于对芯片进行分级的场景。