Method for measuring service life of LED carrier based on scattering parameters
The invention discloses a method for measuring the service life of an LED carrier based on scattering parameters. According to the implementation scheme, the method comprises the steps that the scattering parameters of a target LED under different direct current biases are tested; obtaining an elect...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a method for measuring the service life of an LED carrier based on scattering parameters. According to the implementation scheme, the method comprises the steps that the scattering parameters of a target LED under different direct current biases are tested; obtaining an electro-optical bandwidth based on the forward transmission coefficient S21 of the target LED, and calculating a relational expression between the sum of the carrier lifetime and the RC time constant and the current density by fitting the electro-optical bandwidth and the current density to obtain a functional relational expression; fitting the input reflection coefficient S11 of the target LED through the impedance function of the LED equivalent circuit to obtain electrical parameters of each element in the LED equivalent circuit, and calculating to obtain RC bandwidth; calculating a relational expression between an RC time constant and the current density by fitting a function relational expression between the RC band |
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