Optimal four-parameter continuous sampling inspection scheme

The invention discloses a four-parameter optimal continuous sampling inspection scheme, which comprises the following steps of: 1, giving a tolerance upper limit (USL), a tolerance lower limit (LSL), an average detection quality limit (AOQL) and a confidence level (alpha); 2, determining an effectiv...

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Bibliographische Detailangaben
Hauptverfasser: YUAN RUIYANG, CHEN MANRONG, LI CHUNZHI
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a four-parameter optimal continuous sampling inspection scheme, which comprises the following steps of: 1, giving a tolerance upper limit (USL), a tolerance lower limit (LSL), an average detection quality limit (AOQL) and a confidence level (alpha); 2, determining an effective working interval (AOQL, 10 AOQL); 3, continuously collecting inspection data; 4, calculating a process qualified rate estimator # imgabs0 # and a lower confidence limit (q *) of the process qualified rate estimator # imgabs0 #; 5, making decisions of exemption of inspection, production halt and execution of an optimal scheme according to the comparison of the process qualified rate estimator and the effective working interval (AOQL, 10AOQL); 6, calculating a continuous qualified product number (io3) and a test score (fo3) of the optimal scheme; 7, executing an optimal continuous sampling inspection scheme (io3, fo3, 50, 4); and 8, keeping recording the latest data, and returning to the step 4. On the premise that