Multi-type module conduction test device and test method
The invention aims to provide the multi-type module conduction test device and test method which can reduce the test cost and the operation difficulty, can improve the test efficiency and accuracy, and can accurately record the module conduction test condition. The system comprises a constant curren...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention aims to provide the multi-type module conduction test device and test method which can reduce the test cost and the operation difficulty, can improve the test efficiency and accuracy, and can accurately record the module conduction test condition. The system comprises a constant current source module, an MUX module, an ADC module and an MCU module, the constant current source module is connected to the ADC module through the MUX module, a to-be-tested product is connected to the MUX module, the ADC module is connected to the MCU module, and the MCU module communicates with an external upper computer; the MUX module switches the current value output by the constant current source module, and the MCU module processes the electric signals, collected by the ADC module, on the to-be-tested product. The invention is applied to the technical field of electronic testing.
本发明旨在提供一种能够降低测试成本和操作难度、能够提高测试效率和准确性、能够准确记录模组导通测试情况的多种类模组导通测试装置及测试方法。本发明包括恒流源模块、MUX模块、ADC模块、MCU模块,所述恒流源模块经所述MUX模块接入所述ADC模块,待测产品接入所述MUX模 |
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