Learning effect analysis method and device, storage medium and program product

The embodiment of the invention discloses a learning effect analysis method and device, a storage medium and a program product. The method comprises the following steps: identifying wrong questions according to the answer details of a user, and analyzing the ability performance of the user on the wr...

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1. Verfasser: WANG YANZENG
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The embodiment of the invention discloses a learning effect analysis method and device, a storage medium and a program product. The method comprises the following steps: identifying wrong questions according to the answer details of a user, and analyzing the ability performance of the user on the wrong questions; when the ability performance reaches a preset standard, determining the wrong questions as key questions conforming to the current ability level of the user; analyzing knowledge points related to the key questions, and evaluating the mastering degree of a user on the knowledge points; and proposing learning suggestions according to the mastering degree. According to the method, the key questions can be positioned in the wrong questions of the user, and the mastering degree of the user on the knowledge points related to the key questions is evaluated, so that personalized learning support is provided for the user, and the learning effect of the user is effectively improved. 本公开实施例公开了一种学习效果分析方法、装置、存储介质