Asymmetric binocular imaging measurement microscope and measurement method
The invention belongs to the technical field of optical microscopic measurement, and discloses an asymmetric binocular imaging measurement microscope and a measurement method, and the asymmetric binocular imaging measurement microscope is characterized in that the asymmetric binocular imaging measur...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention belongs to the technical field of optical microscopic measurement, and discloses an asymmetric binocular imaging measurement microscope and a measurement method, and the asymmetric binocular imaging measurement microscope is characterized in that the asymmetric binocular imaging measurement microscope comprises an objective lens module, a beam splitting module, a first eyepiece module, a second eyepiece module, an imaging search circuit and an automatic measurement circuit. When the thickness (or depth) of the object to be measured is small, the image distance difference of two real images formed by the two surfaces of the object to be measured through the objective lens is measured through the second imaging plate, then the magnification factor and the focal length of the objective lens are found out, and the object distance difference of the two surfaces of the object to be measured, namely the thickness (or depth) of the object to be measured, is calculated. When the thickness (or depth) of t |
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