Four-port de-embedding analysis method based on S2P file and medium
The invention discloses a four-port de-embedding analysis method based on an S2P file and a medium, and relates to the field of port de-embedding, and the four-port de-embedding analysis method comprises the following steps: connecting a test fixture and a measuring device to measure original data;...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a four-port de-embedding analysis method based on an S2P file and a medium, and relates to the field of port de-embedding, and the four-port de-embedding analysis method comprises the following steps: connecting a test fixture and a measuring device to measure original data; carrying out calculation by using 12 error term models; the six forward error terms are EDF, ESF, ELF, ERF, ETF and EXF, the six reverse error terms are EDR, ESR, ELR, ERR, ETR and EXR, and a 4 * 4 error term array is used for representing all error terms of the four ports; updating the 4 * 4 error term array by using the test fixture characterization file; and calculating an S parameter by using the updated 4 * 4 error term array. Through formula calculation, the S2P file is used through the global error term array, so that the computational logic complexity is reduced.
本申请公开了一种基于S2P文件的四端口去嵌入分析方法和介质,涉及端口去嵌入领域,本申请包括,连接测试夹具和测量器件测量原始数据;使用12项误差项模型进行计算;6个前向误差项:EDF,ESF,ELF,ERF,ETF,EXF,6个反向误差项:EDR,ESR,ELR,ERR,ETR,EXR,其中用 |
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