Laser on-machine measurement path optimization control method and system under precision constraint
The invention relates to the technical field of laser measurement, and discloses a laser on-machine measurement path optimization control method and system under precision constraint, and the method comprises the steps: presetting a first total error value; modeling is carried out on various types o...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to the technical field of laser measurement, and discloses a laser on-machine measurement path optimization control method and system under precision constraint, and the method comprises the steps: presetting a first total error value; modeling is carried out on various types of errors in laser on-machine measurement so as to obtain corresponding error models; performing error fitting analysis on all the obtained error models, and fitting each difference value to obtain an error adaptability distribution model; taking the first error total value as a target error total value of an error adaptability distribution model, and performing error distribution on each fitting error item in the error adaptability distribution model to obtain a new inclination angle and a displacement value; and the path is optimized and adjusted again according to the new inclination angle and displacement value. According to the method, the endogenous relationship between the measurement error demand and the mea |
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