Diagnostic test method and system based on use efficacy of integrated circuit

The invention discloses a diagnostic test method and system based on the use efficacy of an integrated circuit, and particularly relates to the technical field of integrated circuit detection. The operation saturation degree of the integrated circuit is evaluated according to the working frequency degree and the working duration of the integrated circuit; analyzing the local circuit power receiving influence characteristic matrix of the integrated circuit in combination with optical ranging, and comprehensively evaluating the power receiving influence hidden danger degree of the local circuit; analyzing the vibration characteristics of the operation power change curve of the local circuit relative to the rated power, and evaluating the power stability of the line local circuit during working according to the analysis result; and analyzing the non-external interruption times and the reset time during the working period of the local circuit, and evaluating the system stability of the working of the local circui