Inspection device
An inspection apparatus is disclosed. The inspection apparatus includes: a light source that radiates a light beam; a first lens disposed between the inspection object and the light source, the first lens having a first opening defined therethrough in a first direction; a second lens disposed betwee...
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| creator | GAO HUILAN SANGU AKIFUMI SON JAE-MIN HAHN SEI KWANG |
| description | An inspection apparatus is disclosed. The inspection apparatus includes: a light source that radiates a light beam; a first lens disposed between the inspection object and the light source, the first lens having a first opening defined therethrough in a first direction; a second lens disposed between the inspection object and the first lens, the second lens having a second opening defined therethrough in the first direction to overlap the first opening; an inspection unit disposed to be spaced apart from the inspection object and including an incident portion disposed to overlap the first opening and the second opening on a plane, the first lens interposed between the inspection unit and the inspection object; and a driving unit that adjusts a distance between the first lens and the inspection object or a distance between the second lens and the inspection object.
公开了检查设备。检查设备包括：光源，该光源辐射光束；第一透镜，该第一透镜设置在检查对象与光源之间，具有在第一方向上穿过第一透镜限定的第一开口；第二透镜，该第二透镜设置在检查对象与第一透镜之间，具有在第一方向上穿过第二透镜限定以与第一开口重叠的第二开口；检查单元，该检查单元设置成与检查对象间隔开 |
| format | Patent |
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公开了检查设备。检查设备包括：光源，该光源辐射光束；第一透镜，该第一透镜设置在检查对象与光源之间，具有在第一方向上穿过第一透镜限定的第一开口；第二透镜，该第二透镜设置在检查对象与第一透镜之间，具有在第一方向上穿过第二透镜限定以与第一开口重叠的第二开口；检查单元，该检查单元设置成与检查对象间隔开</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240802&DB=EPODOC&CC=CN&NR=118425187A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240802&DB=EPODOC&CC=CN&NR=118425187A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>GAO HUILAN</creatorcontrib><creatorcontrib>SANGU AKIFUMI</creatorcontrib><creatorcontrib>SON JAE-MIN</creatorcontrib><creatorcontrib>HAHN SEI KWANG</creatorcontrib><title>Inspection device</title><description>An inspection apparatus is disclosed. The inspection apparatus includes: a light source that radiates a light beam; a first lens disposed between the inspection object and the light source, the first lens having a first opening defined therethrough in a first direction; a second lens disposed between the inspection object and the first lens, the second lens having a second opening defined therethrough in the first direction to overlap the first opening; an inspection unit disposed to be spaced apart from the inspection object and including an incident portion disposed to overlap the first opening and the second opening on a plane, the first lens interposed between the inspection unit and the inspection object; and a driving unit that adjusts a distance between the first lens and the inspection object or a distance between the second lens and the inspection object.
公开了检查设备。检查设备包括：光源，该光源辐射光束；第一透镜，该第一透镜设置在检查对象与光源之间，具有在第一方向上穿过第一透镜限定的第一开口；第二透镜，该第二透镜设置在检查对象与第一透镜之间，具有在第一方向上穿过第二透镜限定以与第一开口重叠的第二开口；检查单元，该检查单元设置成与检查对象间隔开</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBD0zCsuSE0uyczPU0hJLctMTuVhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoaGFiZGpoYW5o7GxKgBANajH64</recordid><startdate>20240802</startdate><enddate>20240802</enddate><creator>GAO HUILAN</creator><creator>SANGU AKIFUMI</creator><creator>SON JAE-MIN</creator><creator>HAHN SEI KWANG</creator><scope>EVB</scope></search><sort><creationdate>20240802</creationdate><title>Inspection device</title><author>GAO HUILAN ; SANGU AKIFUMI ; SON JAE-MIN ; HAHN SEI KWANG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN118425187A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>GAO HUILAN</creatorcontrib><creatorcontrib>SANGU AKIFUMI</creatorcontrib><creatorcontrib>SON JAE-MIN</creatorcontrib><creatorcontrib>HAHN SEI KWANG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>GAO HUILAN</au><au>SANGU AKIFUMI</au><au>SON JAE-MIN</au><au>HAHN SEI KWANG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Inspection device</title><date>2024-08-02</date><risdate>2024</risdate><abstract>An inspection apparatus is disclosed. The inspection apparatus includes: a light source that radiates a light beam; a first lens disposed between the inspection object and the light source, the first lens having a first opening defined therethrough in a first direction; a second lens disposed between the inspection object and the first lens, the second lens having a second opening defined therethrough in the first direction to overlap the first opening; an inspection unit disposed to be spaced apart from the inspection object and including an incident portion disposed to overlap the first opening and the second opening on a plane, the first lens interposed between the inspection unit and the inspection object; and a driving unit that adjusts a distance between the first lens and the inspection object or a distance between the second lens and the inspection object.
公开了检查设备。检查设备包括：光源，该光源辐射光束；第一透镜，该第一透镜设置在检查对象与光源之间，具有在第一方向上穿过第一透镜限定的第一开口；第二透镜，该第二透镜设置在检查对象与第一透镜之间，具有在第一方向上穿过第二透镜限定以与第一开口重叠的第二开口；检查单元，该检查单元设置成与检查对象间隔开</abstract><oa>free_for_read</oa></addata></record> |
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| language | chi ; eng |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Inspection device |
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