Workpiece material image quality enhancement method based on two-dimensional four-way stochastic resonance

The invention provides a workpiece material image quality enhancement method based on two-dimensional four-way stochastic resonance, which comprises the following steps of: decomposing original noise of an image through fast adaptive BEMD (Bidirectional Empirical Mode Decomposition) to obtain a plur...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: FAN XUEKE, QIU YUHANG, CHEN XUWEN, ZU HONGFEI, ZHANG XIANG, WANG SHAN
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator FAN XUEKE
QIU YUHANG
CHEN XUWEN
ZU HONGFEI
ZHANG XIANG
WANG SHAN
description The invention provides a workpiece material image quality enhancement method based on two-dimensional four-way stochastic resonance, which comprises the following steps of: decomposing original noise of an image through fast adaptive BEMD (Bidirectional Empirical Mode Decomposition) to obtain a plurality of IMF (Intrinsic Model Function) components and residual quantities, selecting the IMF component containing most feature information through threshold parameters by adopting PSNR (Peak Signal to Noise Ratio) as an evaluation standard, and carrying out image quality enhancement on a workpiece material. The adaptive two-dimensional four-way stochastic resonance system is adopted to transfer noise energy to image features, and meanwhile, the peak signal-to-noise ratio is adopted as an evaluation model of image quality to automatically obtain optimal parameters of the adaptive two-dimensional four-way stochastic resonance system, so that adaptive denoising of the surface quality image of the workpiece material i
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN118396883A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN118396883A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN118396883A3</originalsourceid><addsrcrecordid>eNqNjDEOgkAQRWksjHqH8QAUhMRgaYjGysrEkozLV1bZHdwdQri9W3gAq1e89_8ye90kvAcLA3KsCJZ7so6foM_IvdWZ4Dv2Bg5eyUE7aenOES2JJ50kb21S0YpPy4eMIZ94pqhiOo5qDQXE5NLDOls8uI_Y_LjKtqfjtT7nGKRBHNjAQ5v6UhRVud9VVXko_2m-ATVB_Q</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Workpiece material image quality enhancement method based on two-dimensional four-way stochastic resonance</title><source>esp@cenet</source><creator>FAN XUEKE ; QIU YUHANG ; CHEN XUWEN ; ZU HONGFEI ; ZHANG XIANG ; WANG SHAN</creator><creatorcontrib>FAN XUEKE ; QIU YUHANG ; CHEN XUWEN ; ZU HONGFEI ; ZHANG XIANG ; WANG SHAN</creatorcontrib><description>The invention provides a workpiece material image quality enhancement method based on two-dimensional four-way stochastic resonance, which comprises the following steps of: decomposing original noise of an image through fast adaptive BEMD (Bidirectional Empirical Mode Decomposition) to obtain a plurality of IMF (Intrinsic Model Function) components and residual quantities, selecting the IMF component containing most feature information through threshold parameters by adopting PSNR (Peak Signal to Noise Ratio) as an evaluation standard, and carrying out image quality enhancement on a workpiece material. The adaptive two-dimensional four-way stochastic resonance system is adopted to transfer noise energy to image features, and meanwhile, the peak signal-to-noise ratio is adopted as an evaluation model of image quality to automatically obtain optimal parameters of the adaptive two-dimensional four-way stochastic resonance system, so that adaptive denoising of the surface quality image of the workpiece material i</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240726&amp;DB=EPODOC&amp;CC=CN&amp;NR=118396883A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240726&amp;DB=EPODOC&amp;CC=CN&amp;NR=118396883A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>FAN XUEKE</creatorcontrib><creatorcontrib>QIU YUHANG</creatorcontrib><creatorcontrib>CHEN XUWEN</creatorcontrib><creatorcontrib>ZU HONGFEI</creatorcontrib><creatorcontrib>ZHANG XIANG</creatorcontrib><creatorcontrib>WANG SHAN</creatorcontrib><title>Workpiece material image quality enhancement method based on two-dimensional four-way stochastic resonance</title><description>The invention provides a workpiece material image quality enhancement method based on two-dimensional four-way stochastic resonance, which comprises the following steps of: decomposing original noise of an image through fast adaptive BEMD (Bidirectional Empirical Mode Decomposition) to obtain a plurality of IMF (Intrinsic Model Function) components and residual quantities, selecting the IMF component containing most feature information through threshold parameters by adopting PSNR (Peak Signal to Noise Ratio) as an evaluation standard, and carrying out image quality enhancement on a workpiece material. The adaptive two-dimensional four-way stochastic resonance system is adopted to transfer noise energy to image features, and meanwhile, the peak signal-to-noise ratio is adopted as an evaluation model of image quality to automatically obtain optimal parameters of the adaptive two-dimensional four-way stochastic resonance system, so that adaptive denoising of the surface quality image of the workpiece material i</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjDEOgkAQRWksjHqH8QAUhMRgaYjGysrEkozLV1bZHdwdQri9W3gAq1e89_8ye90kvAcLA3KsCJZ7so6foM_IvdWZ4Dv2Bg5eyUE7aenOES2JJ50kb21S0YpPy4eMIZ94pqhiOo5qDQXE5NLDOls8uI_Y_LjKtqfjtT7nGKRBHNjAQ5v6UhRVud9VVXko_2m-ATVB_Q</recordid><startdate>20240726</startdate><enddate>20240726</enddate><creator>FAN XUEKE</creator><creator>QIU YUHANG</creator><creator>CHEN XUWEN</creator><creator>ZU HONGFEI</creator><creator>ZHANG XIANG</creator><creator>WANG SHAN</creator><scope>EVB</scope></search><sort><creationdate>20240726</creationdate><title>Workpiece material image quality enhancement method based on two-dimensional four-way stochastic resonance</title><author>FAN XUEKE ; QIU YUHANG ; CHEN XUWEN ; ZU HONGFEI ; ZHANG XIANG ; WANG SHAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN118396883A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>FAN XUEKE</creatorcontrib><creatorcontrib>QIU YUHANG</creatorcontrib><creatorcontrib>CHEN XUWEN</creatorcontrib><creatorcontrib>ZU HONGFEI</creatorcontrib><creatorcontrib>ZHANG XIANG</creatorcontrib><creatorcontrib>WANG SHAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>FAN XUEKE</au><au>QIU YUHANG</au><au>CHEN XUWEN</au><au>ZU HONGFEI</au><au>ZHANG XIANG</au><au>WANG SHAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Workpiece material image quality enhancement method based on two-dimensional four-way stochastic resonance</title><date>2024-07-26</date><risdate>2024</risdate><abstract>The invention provides a workpiece material image quality enhancement method based on two-dimensional four-way stochastic resonance, which comprises the following steps of: decomposing original noise of an image through fast adaptive BEMD (Bidirectional Empirical Mode Decomposition) to obtain a plurality of IMF (Intrinsic Model Function) components and residual quantities, selecting the IMF component containing most feature information through threshold parameters by adopting PSNR (Peak Signal to Noise Ratio) as an evaluation standard, and carrying out image quality enhancement on a workpiece material. The adaptive two-dimensional four-way stochastic resonance system is adopted to transfer noise energy to image features, and meanwhile, the peak signal-to-noise ratio is adopted as an evaluation model of image quality to automatically obtain optimal parameters of the adaptive two-dimensional four-way stochastic resonance system, so that adaptive denoising of the surface quality image of the workpiece material i</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN118396883A
source esp@cenet
subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
title Workpiece material image quality enhancement method based on two-dimensional four-way stochastic resonance
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-13T10%3A28%3A54IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=FAN%20XUEKE&rft.date=2024-07-26&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN118396883A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true