Workpiece material image quality enhancement method based on two-dimensional four-way stochastic resonance
The invention provides a workpiece material image quality enhancement method based on two-dimensional four-way stochastic resonance, which comprises the following steps of: decomposing original noise of an image through fast adaptive BEMD (Bidirectional Empirical Mode Decomposition) to obtain a plur...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a workpiece material image quality enhancement method based on two-dimensional four-way stochastic resonance, which comprises the following steps of: decomposing original noise of an image through fast adaptive BEMD (Bidirectional Empirical Mode Decomposition) to obtain a plurality of IMF (Intrinsic Model Function) components and residual quantities, selecting the IMF component containing most feature information through threshold parameters by adopting PSNR (Peak Signal to Noise Ratio) as an evaluation standard, and carrying out image quality enhancement on a workpiece material. The adaptive two-dimensional four-way stochastic resonance system is adopted to transfer noise energy to image features, and meanwhile, the peak signal-to-noise ratio is adopted as an evaluation model of image quality to automatically obtain optimal parameters of the adaptive two-dimensional four-way stochastic resonance system, so that adaptive denoising of the surface quality image of the workpiece material i |
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