IC chip defect detection method, system and equipment and storage medium

The invention discloses an IC chip defect detection method, system and device and a storage medium, the method is applied to a chip detection machine comprising an initial detection station and a redetection station which are connected through a transmission device, and the method comprises the foll...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: CHEN LINCAI, LONG ZHIBIN, LUO JIANHUA, WANG LEYUAN, GU YIKANG
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses an IC chip defect detection method, system and device and a storage medium, the method is applied to a chip detection machine comprising an initial detection station and a redetection station which are connected through a transmission device, and the method comprises the following steps: performing automatic defect detection on a to-be-detected IC chip on the initial detection station; the method comprises the following steps: detecting a defect of a to-be-detected IC chip, marking the to-be-detected IC chip as an initial detection problem chip when the defect is detected, conveying the initial detection problem chip to a redetection station through a transmission device so as to redetect the initial detection problem chip, obtaining redetection data of the initial detection problem chip, and finally performing defect judgment on the initial detection problem chip based on the redetection data. In the embodiment of the invention, automatic defect detection is carried out on the to-be-d