Method, device and equipment for determining compensation projection plane elevation

The invention provides a compensation projection plane elevation determination method, device and equipment, and relates to the technical field of engineering measurement. The method comprises the following steps: calculating a first area projection deformation generated by projecting an actually me...

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Hauptverfasser: ZHAO WENJUN, ZHANG ZHAO, MA XIAPING, HE XIAOLIANG, SHANG HAIXING, XING RUIJIAO, LI RUIXUE, YANG SHUWEN, ZHANG YAO, YIN YEBIAO, ZHAO QINGZHI, KE SHENGXUE, LI ZUFENG, WANG YOULIN
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention provides a compensation projection plane elevation determination method, device and equipment, and relates to the technical field of engineering measurement. The method comprises the following steps: calculating a first area projection deformation generated by projecting an actually measured area of a target area to a reference ellipsoid; calculating a second area projection deformation generated when the projection area of the target area on the reference ellipsoid is projected to the Gaussian plane, and determining an area projection comprehensive deformation according to the first area projection deformation and the second area projection deformation; and calculating a target central meridian distance corresponding to the minimum area projection comprehensive deformation, calculating the average elevation of the target area higher than the compensation projection plane according to the target central meridian distance, and determining the compensation projection plane elevation according to t