Built-in self-test method of TCAM (ternary content addressable memory)

The invention discloses a built-in self-test method for a TCAM (Ternary Content Addressable Memory), which comprises the following steps of: detecting a fixed fault through a simplified March algorithm, and then testing a sensitive coupling fault, a conversion fault and an address decoding fault of adjacent units by using a self-defined enhanced checkerboard method and a diagonal method. The algorithm is realized through a Verilog hardware description language, and compared with a common conventional TCAM test, the chip area is saved, meanwhile, the test coverage rate is increased, and the product defect rate (DPPM) is reduced. 本发明公开了一种TCAM存储器的内建自测试方法，所述方法先通过一种简化的March算法检测固定故障，然后再使用自定义的加强型棋盘格方法和对角线方法测试相邻单元敏感耦合故障、转换故障以及地址译码故障。此算法通过Verilog硬件描述语言实现，相对于一般的常规TCAM测试，它在节省芯片面积的同时，提高了测试覆盖率，降低了产品缺陷率(DPPM)。