Offset monitoring device based on BIM component quality abnormity
The invention belongs to the field of position angle measurement monitoring, and particularly discloses a BIM component quality abnormity-based offset monitoring device, which comprises a torsion limiting mechanism, a self-locking offset monitoring mechanism, an included angle change monitoring mech...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention belongs to the field of position angle measurement monitoring, and particularly discloses a BIM component quality abnormity-based offset monitoring device, which comprises a torsion limiting mechanism, a self-locking offset monitoring mechanism, an included angle change monitoring mechanism and a preset component. Through the self-locking type offset monitoring mechanism, on one hand, slippage between the components can be fed back through slippage of the self-locking type offset monitoring mechanism, on the other hand, when angle changes occur between the components, movement can be transmitted to the included angle change monitoring mechanism in a self-locking mode, and the technical contradiction that a groove type sliding piece needs to slide and cannot slide is overcome.
本发明属于位置角度计量监测领域,具体公开了基于BIM构件质量异常的偏移监测装置,包括扭转限位机构、自锁式偏移监测机构、夹角变化监测机构和预置构件。本发明通过自锁式偏移监测机构一方面能够通过自身的滑移反馈构件之间的滑移,另一方面还能在构件之间发生角度变化时,通过锁止自身的方式将运动传递给夹角变化监测机构,克服了槽式滑动件既要滑动,又不能滑动的技术矛盾。 |
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