Methods, systems, and apparatus for instrument alignment and position teaching
Methods, systems, and apparatus are provided for instrument alignment and position teaching. According to another aspect of the present embodiment, a system for pick and place calibration of a pick and place machine is provided. The system includes a general teaching device, a computing device, and...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | Methods, systems, and apparatus are provided for instrument alignment and position teaching. According to another aspect of the present embodiment, a system for pick and place calibration of a pick and place machine is provided. The system includes a general teaching device, a computing device, and a motor control device. A universal teaching device is configured to teach pick and place locations and is coupleable to a pick head of a pick and place machine. The universal teaching device includes an imaging device for capturing an image in alignment with the center of the pick-up head. The computing device is coupled to the generic teaching device to receive the captured image, and is configured to generate at least one virtual image corresponding to one or more parameters of the captured image. And the motor control device is coupled to the computing device, a pickup head of the pickup and placement machine, and the general teaching device, and is configured to move the pickup head under the control of the co |
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