Memristor read-write test circuit and test method

The invention relates to a memristor read-write test circuit and a test method, and the test circuit is composed of a pulse generation card, an array card and a signal acquisition card, and the array card is used for directly realizing the carrying of different memristor arrays to be tested so as to...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	CHEN CHANGLIN, DIAO JIETAO, SUN YI, YU HONGQI, WANG YINAN, ZHU CHENGHE, LIU HAIJUN, YU XINJUN, LI ZHIWEI, WANG WEI, LI QINGJIANG, SONG BING, LIU SEN, SUN ZHENYUAN, XU HUI, CAO RONGRONG, LIU GUIQING, BU KAI, WANG XI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INFORMATION STORAGE PHYSICS STATIC STORES
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